Fig.2. Failure analysis methodologies used in IC development (a) (b) [1] JCH Phang, DSH Chan, M. Palaniappan, JM Chin, B. Davis, M Bruce, “A review of Laser Induced Techniques for Microelectronic ...

If you would like to discuss a materials analysis problem or ... silicon computer chips have to be prototyped and tested to ensure that the design is perfectly functional. The metal wires and ...

All of these developments make defects harder to find and more expensive to fix, which impacts the reliability of chips and systems. Traditional failure analysis techniques — optical fault isolation, ...

Seemingly AMD cannot catch a break, as shortly after Puget Systems' analysis on AMD Ryzen failure rates, a new story highlighting a core flaw in hundreds of millions of AMD chips emerged.